Modern approaches to the investigation of thin films and monolayers: X-ray reflectometry, grazing incidence scattering and X-ray standing wave method
Maxsim Anatol'evich Shcherbina, Sergei Nikolaevich Chvalun, Sergey Anatol'evich Ponomarenko, Mikhail Valentinovich Koval'chuk
Volume 83, Issue 12, 1091-1119
Communication , 30 November 2013