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Scanning tunnelling and atomic force microscopy in the electrochemistry of surfaces

Aleksei Ivanovich Danilov 1
Aleksei Ivanovich Danilov
1 Institute of Physical Chemistry, Russian Academy of Sciences, Moscow
Published 30 November 1994
Communication , Volume 64, Issue 8, 767-781
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Danilov A. I. Scanning tunnelling and atomic force microscopy in the electrochemistry of surfaces // Russian Chemical Reviews. 1995. Vol. 64. No. 8. pp. 767-781.
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Danilov A. I. Scanning tunnelling and atomic force microscopy in the electrochemistry of surfaces // Russian Chemical Reviews. 1995. Vol. 64. No. 8. pp. 767-781.
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TY - JOUR
DO - 10.1070/RC1995v064n08ABEH000174
UR - https://rcr.colab.ws/publications/10.1070/RC1995v064n08ABEH000174
TI - Scanning tunnelling and atomic force microscopy in the electrochemistry of surfaces
T2 - Russian Chemical Reviews
AU - Danilov, Aleksei Ivanovich
PY - 1995
DA - 1994/11/30
PB - ANO Editorial Board of the journal Uspekhi Khimii
SP - 767-781
IS - 8
VL - 64
ER -
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@article{1995_Danilov,
author = {Aleksei Ivanovich Danilov},
title = {Scanning tunnelling and atomic force microscopy in the electrochemistry of surfaces},
journal = {Russian Chemical Reviews},
year = {1995},
volume = {64},
publisher = {ANO Editorial Board of the journal Uspekhi Khimii},
month = {Nov},
url = {https://rcr.colab.ws/publications/10.1070/RC1995v064n08ABEH000174},
number = {8},
pages = {767--781},
doi = {10.1070/RC1995v064n08ABEH000174}
}
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Danilov, Aleksei Ivanovich. “Scanning tunnelling and atomic force microscopy in the electrochemistry of surfaces.” Russian Chemical Reviews, vol. 64, no. 8, Nov. 1995, pp. 767-781. https://rcr.colab.ws/publications/10.1070/RC1995v064n08ABEH000174.
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Abstract

The theoretical foundations, principle of operation, constructional features, and the latest advances in scanning tunnelling and atomic force microscopy in situ are examined in relation to electrochemical studies on the surfaces of metallic electrodes, and adsorption, and electrocrystallisation processes. The bibliography includes 172 references.

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